Improvement in electrical properties of PbZr0.4Ti0.6O3 thin films using PbTiO3 seeding layer

IEEE International Symposium on Applications of Ferroelectrics

Volumn 2, Issue , 2000, Pages 925-928

  Kim, Chang Jung ^a   Lee, Yong Kyun ^a   Lee, Kyu Mann ^a   Chung, Ilsub ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; POLARIZATION; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING LEAD COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

CHEMICAL SOLUTION DEPOSITION; LEAD TITANATE; LEAD ZIRCONIUM TITANATE; SEEDING LAYER; SWITCHING POLARIZATION;

THIN FILMS;

EID: 0034470636     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)