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Volumn 6134, Issue , 2006, Pages

Reliability of AlGaN-based deep UV LEDs on sapphire

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE; ACTIVATION ENERGY; ALUMINUM COMPOUNDS; CURRENT DENSITY; DEGRADATION; RELIABILITY; THERMAL EFFECTS; ULTRAVIOLET RADIATION;

EID: 33646727159     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.647204     Document Type: Conference Paper
Times cited : (18)

References (22)
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    • Nitride deep-ultraviolet light-emitting diodes with microlens array
    • M. Khizar, Z. Y. Fan, K. H. Kim, J. Y. Lin, H. X. Jiang, "Nitride deep-ultraviolet light-emitting diodes with microlens array" Appl. Phys. Lett. 86 173504-1-173504-3 (2005).
    • (2005) Appl. Phys. Lett. , vol.86
    • Khizar, M.1    Fan, Z.Y.2    Kim, K.H.3    Lin, J.Y.4    Jiang, H.X.5
  • 10
    • 0037011554 scopus 로고    scopus 로고
    • Pulsed atomic layer epitaxy of ultrahigh-quality AlxGa1-xN structures for deep ultraviolet emissions below 230 nm
    • J. P. Zhang, M. Asif Khan, W. H. Sun, H. M. Wang, C. Q. Chen, Q. Fareed, E. Kuokstis, J. W. Yang, "Pulsed atomic layer epitaxy of ultrahigh-quality AlxGa1-xN structures for deep ultraviolet emissions below 230 nm", Appl. Phys. Lett. 81, 4392-4394 (2002).
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 4392-4394
    • Zhang, J.P.1    Khan, M.A.2    Sun, W.H.3    Wang, H.M.4    Chen, C.Q.5    Fareed, Q.6    Kuokstis, E.7    Yang, J.W.8
  • 12
    • 79955997004 scopus 로고    scopus 로고
    • AlN/AlGaN supplattices as dislocation filter for low threading dislocation thick AlGaN layers on sapphire
    • H. M. Wang, J. P. Zhang, C. Q. Chen, Q. Fareed, J. W. Yang, and M. A. Khan, "AlN/AlGaN supplattices as dislocation filter for low threading dislocation thick AlGaN layers on sapphire", Appl. Phys. Lett. 81, 604-606 (2002).
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 604-606
    • Wang, H.M.1    Zhang, J.P.2    Chen, C.Q.3    Fareed, Q.4    Yang, J.W.5    Khan, M.A.6
  • 14
    • 27844599328 scopus 로고    scopus 로고
    • Fine structure of AlN/AlGaN superlatitice grown by pulsed atomic layer epitaxy for dislocation filtering
    • W. H. Sun, J. P. Zhang, J. W. Yang, H. P. Maruska, M. Asif Khan, R. Liu, F. A. Ponce, "Fine structure of AlN/AlGaN superlatitice grown by pulsed atomic layer epitaxy for dislocation filtering", Appl. Phys. Lett. 87, 211915-1-211915-3 (2005).
    • (2005) Appl. Phys. Lett. , vol.87
    • Sun, W.H.1    Zhang, J.P.2    Yang, J.W.3    Maruska, H.P.4    Khan, M.A.5    Liu, R.6    Ponce, F.A.7
  • 20
    • 0001466490 scopus 로고    scopus 로고
    • Influence of defects on the electrical and optical characteristics of blue light-emitting diodes based on III-V nitrides
    • I. Martil, E. Redondo, A. Ojeda, "Influence of defects on the electrical and optical characteristics of blue light-emitting diodes based on III-V nitrides", J. Appl. Phys. 81 2442-2444 (1997).
    • (1997) J. Appl. Phys. , vol.81 , pp. 2442-2444
    • Martil, I.1    Redondo, E.2    Ojeda, A.3
  • 22
    • 17444385288 scopus 로고    scopus 로고
    • Evidence of correlation between dark spots and dislocations originating from substrate in light-emitting diodes
    • K. Hobo, H. Sone, T. Kato, M. Hirotani, T. Saka, "Evidence of correlation between dark spots and dislocations originating from substrate in light-emitting diodes" Jpn. J. Appl. Phys. 44 1004-1008 (2005).
    • (2005) Jpn. J. Appl. Phys. , vol.44 , pp. 1004-1008
    • Hobo, K.1    Sone, H.2    Kato, T.3    Hirotani, M.4    Saka, T.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.