Electron channelling contrast imaging characterization of dislocation structures associated with extrusion and intrusion systems and fatigue cracks in copper single crystals

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 6, 2001, Pages 1473-1488

  Ahmed, J ^a   Wilkinson, A J ^a   Roberts, S G ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRACKS; EXTRUSION; SCANNING ELECTRON MICROSCOPY;

DISLOCATION STRUCTURES;

SINGLE CRYSTALS;

EID: 0035354595     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610108214358     Document Type: Article

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