Orientation determination and defect analysis in the near-cubic intermetallic γ-TiAl using SACP, ECCI, and EBSD

Intermetallics

Volumn 11, Issue 3, 2003, Pages 215-223

  Simkin, B A ^a   Ng, B C ^a   Bieler, T R ^a   Crimp, M A ^a   Mason, D E ^a  

^a Michigan State University   (United States)

Author keywords

A. TiAl; Deformation

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; DEFORMATION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; TRACE ANALYSIS;

ELECTRON CHANNELING CONTRAST IMAGING (ECCI); LOCALIZED ROTATION;

INTERMETALLICS;

EID: 0037363412     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(02)00236-4     Document Type: Article

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