Detection-angle and polarization dependences of the interferometric imaging with near-field scanning microscopy

Guangxue Xuebao/Acta Optica Sinica

Volumn 26, Issue 3, 2006, Pages 425-429

  Liu, Cheng ^a   Yan, Changchun ^a   Gao, Shumei ^b  

^a JIANGSU NORMAL UNIVERSITY   (China)

^b JIANGNAN UNIVERSITY   (China)

Author keywords

Imaging systems; Interaction between evanescent field and probe; Microscopy; Scanning near field optical microscope

Indexed keywords

IMAGING SYSTEMS; INTERFEROMETRY; LIGHTING; POLARIZATION; PROBES; SCANNING;

DETECTION ANGLE; DETECTOR POSITION; EVANESCENT FIELD; EVANESCENT ILLUMINATION; POINT DIPOLE SYSTEM; POLARIZATION DEPENDENCES; REFERENCE LIGHT; SCANNING NEAR FIELD OPTICAL MICROSCOPE; VICE VERSA;

MICROSCOPES;

EID: 33646498362     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

1. J. A. Cline, M. Isaason. Probe-sample interaction in reflection near-field scanning optical microscopy[J]. Appl. Opt., 1995, 34(22): 4869-4876
2. F. Zenhausern, M. P. O'Boyle, H. K. Wickramsinghe. Apertureless near-field optical microscopy[J]. Appl. Phys. Lett., 1994, 65(13): 1623-1625
3. Wu Qinghua, Wang Guiying, Xu Zhizhan. Influence of polarization of the incident light on imaging of the RSNOM[J]. Acta Optica Sinica, 2003, 23(5): 513-516 (in Chinese)
4. Liu Xiumei, Wang Jia. Research on characterization of the near-field distribution of optical fiber probe by FDTD[J]. Acta Optica Sinica, 2001, 21(10): 1234-1238 (in Chinese)
5. Hong Tao, Wang Jia, Sun Liqun et al.. Numerical simulation analysis of near-field optical virtual probe[J]. Acta Optica Sinica, 2002, 22(12): 1415-1420 (in Chinese)
6. Xu Tiejun, Wang Jia, Sun Liqun et al.. Aperture design of nano-aperture semiconductor laser[J]. Acta Optica Sinica, 2002, 22(12): 1421-1425 (in Chinese)
7. P. L. Phillips, J. C. Knight, J. M. Pottage. Direct measurement of optical phase in the near field[J]. Appl. Phys. Lett., 2000, 76(5): 541-543
8. H. F. Hamann, A. Gallagher, D. J. Nesbitt. Enhanced sensitivity near-field scanning optical microscopy as high resolution[J]. Appl. Phys. Lett., 1998, 73(11): 1469-1471
9. R. Hillenbrand, F. Keilmann. Optical oscillation modes of plasmon particles observed in direct space by phase-contrast near-field microscopy[J]. Appl. Phys. B, 2001, 73(3): 239-243
10. B. Knoll, F. Keilmann. Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy[J]. Opt. Commun., 2000, 182(4): 321-328
11. Antonello Nesci, Rene Dandliker, Hans Peter Herzig. Quantiative amplitude and phase measurement by use of a heterodyne scanning near-field optical microscope[J]. Opt. Lett., 2001, 26(4): 208-210
12. R. Hillenbrand, F. Keilmann. Complex optical constants on subwavelength scale[J]. Phys. Rev. Lett., 2000, 85(14): 3029-3032
13. M. Xiao. Theoretical treatment for scattering near-field optical microscopy[J]. J. Opt. Soc. Am. A, 2001, 14(11): 2977-2984
14. M. Xiao. On near-field scanning optical microscopy: Homogeneous and evanescent radiation[J]. J. Modern Optics, 1997, 44(2): 327-344
15. M. Xiao, S. Bozhevolnyi, O. Keller. Numerical study of configurational resonances in near-field optical microscopy with a mesoscopic metallic probe[J]. Appl. Phys. A, 1996, 62(1): 115-121
16. Tero Setala, Matti Kaivola, Ari T. Friberg. Evanescent and propagating electromagnetic fields in scattering form point-dipole structures[J]. J. Opt. Soc. Am. A, 2001, 18(3): 678-688