Influence of polarization of the incident light on imaging of the RSNOM

Guangxue Xuebao/Acta Optica Sinica

Volumn 23, Issue 5, 2003, Pages 513-516

  Wu, Qinghua ^a   Wang, Guiying ^a   Xu, Zhizhan ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Evanescent field; Homogenous field; Near field optics; Polarization of incident light; Reflection scanning near field optical microscopy (RSNOM); System resolution

Indexed keywords

COMPUTER SIMULATION; GREEN'S FUNCTION; IMAGING SYSTEMS; LIGHT POLARIZATION;

EVANESCENT FIELD; HOMOGENOUS FIELD; POLARIZATION OF INCIDENT LIGHT; REFLECTION SCANNING NEAR FIELD OPTICAL MICROSCOPY; SYSTEM RESOLUTION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0042467666     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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