Numerical study of configurational resonances in near-field optical microscopy with a mesoscopic metallic probe

Applied Physics A: Materials Science and Processing

Volumn 62, Issue 2, 1996, Pages 115-121

  Xiao, M ^a   Bozhevolnyi, S ^a   Keller, O ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; NUMERICAL ANALYSIS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; POLARIZATION; RESONANCE; SPECIMEN PREPARATION; SPHERES;

SCANNING NEAR-FIELD OPTICAL MICROSCOPY;

METALS;

EID: 0030083907     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050274     Document Type: Article

References (23)