Flip-chip mounting for improved thermal management of AlGaN/GaN HFETs

Materials Research Society Symposium Proceedings

Volumn 892, Issue , 2006, Pages 389-394

  Ji, Hangfeng ^a   Sarua, Andrei ^a   Kuball, Martin ^a   Das, Jo ^b   Ruythooren, Wouter ^b   Germain, Marianne ^b   Borghs, Gustaaf ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

FLIP CHIP DEVICES; GALLIUM NITRIDE; HETEROJUNCTIONS; RAMAN SPECTROSCOPY; THERMAL CONDUCTIVITY; THERMOGRAPHY (IMAGING);

3D TEMPERATURE SIMULATIONS; DEVICE THERMAL MANAGEMENT; FLIP-CHIP CONTACT BUMP LAYOUT; MICRO-RAMAN SPECTROSCOPY;

FIELD EFFECT TRANSISTORS;

EID: 33646424106     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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2. L. F. Eastman, V. Tilak, V. Kaper, J. Smart, R. Thompson, B. Green, J. R. Shealy and T. Prunty, "Progress in high-power, high frequency AlGaN/GaN HEMTs", Phys. Stat. Sol(a). 194,433 (2002).
3. Y. F. Wu, D. Kapolnek, J. P. Ibbetson, P. Parikh, B. P. Keller, and U. K. Mishra, "Very-high power density AlGaN/GaN HEMTs," IEEE Trans. Elec. Dev. 48,586 (2001).
4. M. Kuball, J. M. Hayes, M. J. Uren, T. Martin, J. C. H. Birbeck, R. S. Balmer and B. T. Hughes, "Measurement of Temperature in Active High-Power AlGaN/GaN HFETs Using Raman Spectroscopy", IEEE Elec. Dev. Lett. 23, 7 (2002).
5. 4 surface layer", J. Appl. Phys. 98, 054501 (2005)
6. J. McDonald, "Microthermal imaging in the infrared", http://www.Electronics-Cooling.com/Resources/EC_Articles/JAN97/ian97_04.htm
7. J. C. Freeman, "Channel Temperature Model for Microwave AlGaN/GaN HEMTs on SiC and Sapphire MMICs in High Power, High Efficiency SSPAs", http://gltrs.grc.nasa.gov/reports/2004/TM-2004-212900.pdf
8. M. Kuball, S. Rajasingam, A. Sarua, M. J. Uren, T. Martin, B. T. Hughes, K. P. Hilton and R. S. Balmer, "Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Roman spectroscopy", Appl. Phys. Lett. 82, 124 (2003)