Optical properties, electronic structure and London dispersion interactions for nanostructured interfacial and surficial films

Materials Science and Engineering: A

Volumn 422, Issue 1-2, 2006, Pages 136-146

  Tan, G L ^a   French, Roger H ^a,b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

Electronic structure; Films; Interfacial; London dispersion interaction; Optical properties; Surficial; Van der Waals forces

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; VAN DER WAALS FORCES;

KRAMERS-KRONIG ANALYSIS; LIFSHITZ THEORY; LONDON DISPERSION INTERACTION;

AMORPHOUS FILMS;

AMORPHOUS FILMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; VAN DER WAALS FORCES;

EID: 33646092054     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.01.010     Document Type: Article

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