Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry

Journal of the American Ceramic Society

Volumn 86, Issue 11, 2003, Pages 1885-1892

  Tan, Guo Long ^a,c   Lemon, Michael F ^b   French, Roger H ^a,b,c  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b DUPONT COMPANY   (United States)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTRONIC STRUCTURE; ELECTROOPTICAL DEVICES; ELLIPSOMETRY; EXTRAPOLATION; FUSED SILICA; OPTICAL PROPERTIES; PHOTOCONDUCTIVITY; ULTRAVIOLET SPECTROSCOPY; VACUUM;

INTERATOMIC BONDS; LONDON DISPERSION FORCES;

AMORPHOUS SILICON;

EID: 0344585353     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2003.tb03577.x     Document Type: Article

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