Improvement of magnetic properties of (111)-epitaxial nickel-zinc-ferrite thin films deposited on Si platform

Key Engineering Materials

Volumn 269, Issue , 2004, Pages 245-248

  Wakiya, Naoki ^a   Shinozaki, Kazuo ^a   Mizutani, Nobuyasu ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Buffer layer; Epitaxial; Ferrite; Thin Film

Indexed keywords

EXCIMER LASERS; FERRITE; LATTICE CONSTANTS; MAGNETIZATION; NICKEL ALLOYS; PULSED LASER DEPOSITION; SILICON; WAVELENGTH DISPERSIVE SPECTROSCOPY;

BUFFER LAYER; EPITAXIAL; ROOT MEAN SQUARE (RMS); WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROSCOPY (WDS);

THIN FILMS;

EID: 8644290141     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (5)

1. N. Wakiya, D. Bao, K. Shinozaki, and N. Mizutani, Ferroelectrics 273, 149 (2002).
2. N. Wakiya, K. Shinozaki, and N. Mizutani, Jpn. J. Appl. Phys. 41, 7242 (2002).
3. Y. Suzuki, R. B. van Dover, E. M. Gyorgy, J. M. Phillips, V. Korenivski, D. J. Werder, C. H. Chen, R. J. Cava, J. J. Krajewski, W. F. Peck and K. B. Do, Appl. Phys. Lett., 68, 714 (1996).
4. D. T. Margulies, F. T. Parker, M. L. Rudee, F. E. Spada, J. N. Chapman, P. R. Aitchison, and A. E. Berkowitz, Phys. Rev. B 53, 9175 (1996).
5. D. T. Margulies, F. T. Parker, M. L. Rudee, F. E. Spada, J. N. Chapman, P. R. Aitchison, and A. E. Berkowitz, Phys. Rev. Lett. 79, 5162 (1997).