Elimination of parasitic effects due to measurement conditions of SrTiO3 thin films up to 40 GHz

Journal of the European Ceramic Society

Volumn 26, Issue 10-11, 2006, Pages 1841-1844

  Iwazaki, Y ^a   Ohta, K ^a   Suzuki, T ^a  

^a TAIYO YUDEN CO LTD   (Japan)

Author keywords

BaTiO3 and titanates; Capacitors; Dielectric properties; Films; Microwave

Indexed keywords

BARIUM TITANATE; CAPACITORS; CRYSTALLINE MATERIALS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; PERMITTIVITY; THIN FILMS;

MICROWAVE PROPERTIES; PARASITIC EFFECTS; PROBE CONTACT POSITION;

STRONTIUM COMPOUNDS;

BARIUM TITANATE; CAPACITORS; CRYSTALLINE MATERIALS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; PERMITTIVITY; STRONTIUM COMPOUNDS; THIN FILMS;

EID: 33645538380     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.09.012     Document Type: Conference Paper

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