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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 7, 2001, Pages 4599-4603

Influence of the microstructures on the dielectric properties of ZrTiO4 thin films at microwave-frequency range

(4) Kim, Y a Oh, J a Kim, T G a Park, B a

a Seoul National University (South Korea)

Author keywords

Dielectric loss; Microwave; Paraelectric; Strain; ZrTiO4 thin films

Indexed keywords

DIELECTRIC LOSSES; MICROSTRUCTURE; MICROWAVES; PERMITTIVITY; STRAIN; ZIRCONIUM COMPOUNDS;

MICROWAVE-FREQUENCY RANGES;

THIN FILMS;

EID: 0035388260 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.4599 Document Type: Article

Times cited : (22)

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