Crystallinity dependence of microwave dielectric properties in (Ba,Sr)TiO3 thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 3, 2003, Pages 1315-1319

  Kim, Tae Gon ^a   Oh, Jeongmin ^a   Kim, Yongjo ^a   Moon, Taeho ^a   Hong, Kug Sun ^a   Park, Byungwoo ^a  

^a Seoul National University   (South Korea)

Author keywords

(Ba,Sr)TiO3; Crystallinity; Dielectric constant; Dielectric loss; Microscopic polar region; Microwave

Indexed keywords

BARIUM COMPOUNDS; CAPACITORS; CRYSTAL GROWTH; CRYSTAL LATTICES; DEPOSITION; DIELECTRIC LOSSES; MICROWAVES; PERMITTIVITY; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINITY DEPENDENCE;

THIN FILMS;

EID: 0037615176     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.1315     Document Type: Article

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