Scanning probe with tuning fork sensor, microfabricated silicon cantilever and conductive tip for microscopy at cryogenic temperature

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 1992-1995

  Akiyama, Terunobu ^a   Suter, Kaspar ^a   De Rooij, Nicolaas F ^a   Baumgartner, Andreas ^b   Gildemeister, Arnd E ^b   Ihn, Thomas ^b   Ensslin, Klaus ^b   Staufer, Urs ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

Atomic force microscope; Conductive tip; Cryogenic temperature; Microfabrication; Quantum device; Quartz tuning fork; Scanning probe microscope

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTRIC POWER TRANSMISSION; PROBES; QUANTUM INTERFERENCE DEVICES; QUARTZ;

CONDUCTIVE TIP; CRYOGENIC TEMPERATURE; MICROFABRICATION; QUANTUM DEVICES; QUARTZ TUNING-FORK; SCANNING PROBE MICROSCOPE;

SILICON SENSORS;

EID: 33645533137     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.1992     Document Type: Article

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