Microwave properties of BST and BST/BMT thin films grown on sapphire substrate by evanescent microwave probe

Integrated Ferroelectrics

Volumn 77, Issue , 2006, Pages 45-50

  Joseph, P T ^a,c   Chen, Yi Chun ^b   Chu, Yin Hao ^c   Cheng, Hsiu Fung ^b   Tai, Nyan Hwa ^c   Lin, I Nan ^a  

^a TAMKANG UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

(Ba0.6Sr0.4)TiO3 thin films; Ba(Mg 1 3Ta2 3)O3 buffer layer; Microwave dielectric properties; Pulsed laser deposition

Indexed keywords

BISMUTH COMPOUNDS; DYNAMIC RANDOM ACCESS STORAGE; FILM GROWTH; MICROWAVE DEVICES; PERMITTIVITY; PROBES;

BUFFER LAYER; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE FREQUENCIES; SAPPHIRE SUBSTRATES;

THIN FILMS;

EID: 33645527242     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580500414044     Document Type: Conference Paper

References (12)

1. M. W. Cole, P. C. Joshi, M. Ervin, M. Wood, and R. L. Pfeifer, J. Appl. Phys 92, 3967 (2002).
2. L. A. Knauss, J. M. Pond, S. J. Horwitz, D. B. Chrisey, C. H. Mueller, and R. Treece, Appl. Phys. Lett. 69, 25 (1992).
3. R. Babbit, T. Koscica, W. Drach, and L. Didomenico, Integrated Ferroelectrics 8, 65 (1995).
4. S. S. Gevorgian and E. L. Kollberg, IEEE Trans. on Microwave Theory and Techniques 49, 21 17 (2001).
5. C. L. Chen, H. H. Feng, Z. Zhang, A. Brazdeikis, Z. J. Huang, W. K. Chu, and C. W. Chu, Appl. Phys. Lett. 75, 412 (1999).
6. Yi-Chun Chen, Yun-Shuo Hsieh, Hsiu-Fung Cheng, and I-Nan Lin, J. of Electroceramics 13, 261 (2004).
7. O. Auciello, J. F. Scott, and R. Ramesh, Phys. Today 7, 22 (1998).
8. C. Gao and X.-D. Xiang, Rev. Sci. Instrum. 69, 3846 (1998).
9. T. Wei, X.-D. Xiang, W. G. Wallace-Freedman, and P. G. Schultz, Appl. Phys. Lett. 68, 3506 (1996).
10. D. E. Steinhauer, C. P. Valhacos, F. C. Wellstood, S. M. Anlage, C. Canedy, R. Ramesh, A. Stanishevlesky, and J. Melngailis, Appl. Phys. Lett. 75, 32180 (1999).
11. Yalin Lu, Tao Wei, Fred Duewer, Yanqing Lu, Nai-Ben Ming, P. G. Schultz, and X.-D. Xiang, Science 276, 2004 (1997).
12. Y. G. Wang, M. E. Reeves, W. J. Kim, J. S. Horwitz, and E. J. Rachford, Appl. Phys. Lett. 78, 3872 (2001).