Detailed studies of molecular conductance using atomic resolution scanning tunneling microscopy

Nano Letters

Volumn 6, Issue 3, 2006, Pages 390-397

  Pitters, Jason L ^a   Wolkow, Robert A ^b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DECOMPOSITION; DESORPTION; ELECTRIC POTENTIAL; OLEFINS; SCANNING TUNNELING MICROSCOPY; SILICON; STYRENE; SURFACE PHENOMENA;

ADSORPTION STATE; CURRENT-VOLTAGE SPECTROSCOPY; ELECTRODE LEVELS; RANDOM CONFIGURATION;

MOLECULAR PHYSICS;

EID: 33645455822     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0521569     Document Type: Article

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