Synchrotron x-ray study of multilayers in Laue geometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5537, Issue , 2004, Pages 127-132

  Kang, H C ^a   Stephenson, G B ^a   Liu, C ^b   Conley, R ^b   Macrander, A T ^b   Maser, J ^b   Bajt, S ^c   Chapman, H N ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Focusing; Laue diffraction; Multilayer; X ray optics

Indexed keywords

BRAGG REFLECTION; LAUE DIFFRACTION; LAUE GEOMETRY; TRANSVERSE SCATTERING;

COMPUTATIONAL GEOMETRY; CUTTING; FOCUSING; LITHOGRAPHY; POLISHING; SCATTERING; SYNCHROTRON RADIATION; X RAY OPTICS;

MULTILAYERS;

EID: 15844390610     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.560173     Document Type: Conference Paper

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