Stability/instability of conductivity and work function changes of ITO thin films, UV-irradiated in air or vacuum. Measurements by the four-probe method and by Kelvin force microscopy

Synthetic Metals

Volumn 122, Issue 1, 2001, Pages 87-89

  Olivier, J ^a   Servet, B ^a   Vergnolle, M ^a   Mosca, M ^a   Garry, G ^a  

^a THALES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AIR; ANODES; DEGRADATION; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; LIGHT EMITTING DIODES; SEMICONDUCTING INDIUM COMPOUNDS; THIN FILMS; TRANSPARENCY; ULTRAVIOLET RADIATION; VACUUM APPLICATIONS;

INDIUM OXIDE; INDIUM TIN OXIDE; KELVIN FORCE MICROSCOPY; ORGANIC LIGHT EMITTING DIODES (OLED); PULSED LASER DEPOSITION; WORK FUNCTION;

SEMICONDUCTING FILMS;

EID: 0034830446     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(00)01337-0     Document Type: Article

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