Defect-tolerant adder circuits with nanoscale crossbars

IEEE Transactions on Nanotechnology

Volumn 5, Issue 2, 2006, Pages 97-100

  Hogg, Tad ^a   Snider, Greg S ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Circuit reliability; Molecular electronics; Nanotechnology

Indexed keywords

DEFECT-FREE CROSSBAR; DEFECT-TOLERANT ADDER CIRCUITS; MOLECULAR ELECTRONICS; YIELD AND CIRCUIT AREA;

CROSSBAR EQUIPMENT; DEFECTS; NETWORKS (CIRCUITS); REDUNDANT MANIPULATORS;

ADDERS;

EID: 33644997580     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2006.869684     Document Type: Article

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