Electrical and interfacial properties of nonalloyed Ti/Au ohmic and Pt Schottky contacts on Zn-terminated ZnO

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 A, 2006, Pages 1560-1565

  Kim, Han Ki ^a   Kim, Sang Woo ^a   Yang, Beelyong ^a   Kim, Sang Ho ^b   Lee, Kwang Hoon ^c   Ji, Seung Hyun ^c   Yoon, Young Soo ^c  

^a Kumoh National Institute of Technology   (South Korea)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

^c Konkuk University   (South Korea)

Author keywords

Ohmic; Pt contact; Schottky contact; Ti Au contact; ZnO

Indexed keywords

DIFFUSION; ELECTRON MICROSCOPY; INTERFACES (MATERIALS); PLATINUM; TITANIUM; ZINC OXIDE;

OHMIC; PT CONTACTS; SCHOTTKY CONTACTS; TI/AU CONTACT;

OHMIC CONTACTS;

EID: 33644930613     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.1560     Document Type: Article

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