STM study of the geometric and electronic structure of ZnO(0 0 0 1)-Zn, (0 0 0 1̄)-O, (1 0 1̄ 0), and (1 1 2̄ 0) surfaces

Surface Science

Volumn 519, Issue 3, 2002, Pages 201-217

  Dulub, Olga ^a   Boatner, Lynn A ^b   Diebold, Ulrike ^a  

^a Tulane University   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Low energy electron diffraction (LEED); Low energy ion scattering (LEIS); Low index single crystal surfaces; Scanning tunneling microscopy; Semiconducting surfaces; Surface defects; Surface structure, morphology, roughness, and topography; Zinc oxide

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEFECTS; ELECTRONIC STRUCTURE; IONS; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

LOW ENERGY ION SCATTERING (LEIS) SPECTROSCOPY;

ZINC OXIDE;

EID: 0037058322     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02211-2     Document Type: Article

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