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Volumn 504, Issue 1-2, 2006, Pages 227-230

Characterization of copper chemical mechanical polishing (CMP) in nitric acid-hydrazine based slurry for microelectronic fabrication

Author keywords

Chemical mechanical polishing; Copper; Hydrazine

Indexed keywords

ETCHING; HYDRAZINE; NITRIC ACID; SLURRIES; SURFACE ROUGHNESS;

EID: 33644896780     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.09.128     Document Type: Conference Paper
Times cited : (21)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.