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Volumn 150, Issue 11, 2003, Pages

Effect of hydrogen peroxide on oxidation of copper in CMP slurries containing glycine

Author keywords

[No Author keywords available]

Indexed keywords

AMINO ACIDS; CHEMICAL MECHANICAL POLISHING; COMPOSITION EFFECTS; DISSOLUTION; ELECTROCHEMISTRY; HYDROGEN PEROXIDE; OXIDATION; PASSIVATION; PH EFFECTS; SLURRIES;

EID: 0242425781     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1615611     Document Type: Article
Times cited : (96)

References (25)
  • 11
    • 0033728545 scopus 로고    scopus 로고
    • Chemical Polishing Fundamentals and Challenges
    • S. V. Babu, S. Danyluk, M. Krishnan, and M. Tsujimura, Editors
    • M. Hariharaputhiran, S. Ramarajan, and S. V. Babu, in Chemical Polishing Fundamentals and Challenges, S. V. Babu, S. Danyluk, M. Krishnan, and M. Tsujimura, Editors, Vol. 566, p. 129, MRS Symposium Proceedings, Warrendale, PA (1999).
    • MRS Symposium Proceedings, Warrendale, PA (1999) , vol.566 , pp. 129
    • Hariharaputhiran, M.1    Ramarajan, S.2    Babu, S.V.3
  • 13
    • 0009551920 scopus 로고    scopus 로고
    • R. Woods, F. M. Doyle, and S. Licht, Editors; The Electrochemical Society Proceedings Series, Pennington, NJ
    • S. Aksu and F. M. Doyle, in Electrochemistry in Mineral and Metal Processing, R. Woods, F. M. Doyle, and S. Licht, Editors, PV 2000-14, p. 258, The Electrochemical Society Proceedings Series, Pennington, NJ (2000).
    • (2000) Electrochemistry in Mineral and Metal Processing , vol.PV 2000-14 , pp. 258
    • Aksu, S.1    Doyle, F.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.