-
1
-
-
0036819797
-
Status quo and future prospects for metallized polypropolene energy storage capacitors
-
M. Rabuffi and G. Picci. "Status quo and future prospects for metallized polypropolene energy storage capacitors," IEEE Trans. Plasma Sci., 30, 1939-42 (2002).
-
(2002)
IEEE Trans. Plasma Sci.
, vol.30
, pp. 1939-1942
-
-
Rabuffi, M.1
Picci, G.2
-
2
-
-
0015571420
-
Expitaxial grown AlN and its optical band gap
-
W.M. Yim, E.J. Stofko, P.J. Zanzucchi, J.I. Pankove, M. Ettenberg, and S.L. Gilbert. "Expitaxial grown AlN and its optical band gap," J. Appl. Phys., 44, 292-6 (1973).
-
(1973)
J. Appl. Phys.
, vol.44
, pp. 292-296
-
-
Yim, W.M.1
Stofko, E.J.2
Zanzucchi, P.J.3
Pankove, J.I.4
Ettenberg, M.5
Gilbert, S.L.6
-
3
-
-
0031131274
-
3, Si, and 6H-SiC by pulsed laser deposition
-
3, Si, and 6H-SiC by pulsed laser deposition.," Thin Solid Films, 299, 94-103 (1997).
-
(1997)
Thin Solid Films
, vol.299
, pp. 94-103
-
-
Vispute, R.D.1
Narayan, J.2
Budai, J.D.3
-
4
-
-
1842427341
-
Thickness dependence of the properties of highly c-axis textured AlN thin films
-
F. Martin, P. Muralt, M.-A. Dubois, and A. Pezous. "Thickness dependence of the properties of highly c-axis textured AlN thin films." J. Vac. Sci. Technol. A, 22, 361-5 (2004).
-
(2004)
J. Vac. Sci. Technol. A
, vol.22
, pp. 361-365
-
-
Martin, F.1
Muralt, P.2
Dubois, M.-A.3
Pezous, A.4
-
5
-
-
0033149167
-
Electrical properties of AlN thin films deposited at low temperature on Si(100)
-
C.L Aardahl, J.W. Rogers Jr., H.K Yun, Y. Ono, D.J. Tweet, S.-T. Hsu. "Electrical properties of AlN thin films deposited at low temperature on Si(100)." Thin Solid Films, 146, 174-80 (1999).
-
(1999)
Thin Solid Films
, vol.146
, pp. 174-180
-
-
Aardahl, C.L.1
Rogers Jr., J.W.2
Yun, H.K.3
Ono, Y.4
Tweet, D.J.5
Hsu, S.-T.6
-
6
-
-
0036476104
-
Microstructure and thermal stability of aluminum nitride thin films deposited at low temperature on silicon
-
K.K. Harris, B.P. Gila, J. Deroaches, K.N. Lee, J.D. MacKenzie, C.R. Abernatny, F. Ren, and S.J. Pearton. "Microstructure and thermal stability of aluminum nitride thin films deposited at low temperature on silicon." J Electrochem. Soc., 149, G128-G130 (2002).
-
(2002)
J Electrochem. Soc.
, vol.149
-
-
Harris, K.K.1
Gila, B.P.2
Deroaches, J.3
Lee, K.N.4
MacKenzie, J.D.5
Abernatny, C.R.6
Ren, F.7
Pearton, S.J.8
-
7
-
-
0033285750
-
Optical and dielectric properties of dc magnetron sputtered AlN thin films correlated with deposition conditions
-
V. Dimitrova, D. Manova, and E. Valcheva. "Optical and dielectric properties of dc magnetron sputtered AlN thin films correlated with deposition conditions." Mater. Sci. Eng. B 68, 1-4 (1999).
-
(1999)
Mater. Sci. Eng. B
, vol.68
, pp. 1-4
-
-
Dimitrova, V.1
Manova, D.2
Valcheva, E.3
-
8
-
-
0032122139
-
Magnetron sputtering of aluminum using oxygen or nitrogen as reactive gas
-
J. Schulte and G. Sobe. "Magnetron sputtering of aluminum using oxygen or nitrogen as reactive gas." Thin Solid Films, 324 (1998): 19-24.
-
(1998)
Thin Solid Films
, vol.324
, pp. 19-24
-
-
Schulte, J.1
Sobe, G.2
-
10
-
-
0032370406
-
Structural characteristics of AlN films deposited by pulsed laser deposition and reactive magnetron sputtering: A comparative study
-
K. Jagannadham, K. Sharma, Q. Wei, R. Kalyanraman, and J. Narayan. "Structural characteristics of AlN films deposited by pulsed laser deposition and reactive magnetron sputtering: A comparative study." J. Vac. Sci. Technol. A 16, 2804-15 (1998).
-
(1998)
J. Vac. Sci. Technol. A
, vol.16
, pp. 2804-2815
-
-
Jagannadham, K.1
Sharma, K.2
Wei, Q.3
Kalyanraman, R.4
Narayan, J.5
-
11
-
-
3042615298
-
Nearly amorphous to epitxial growth of aluminum nitride films
-
T.T. Leung and C.W. Ong. "Nearly amorphous to epitxial growth of aluminum nitride films," Diamond Rel. Mater. 13, 1603-8 (2004).
-
(2004)
Diamond Rel. Mater.
, vol.13
, pp. 1603-1608
-
-
Leung, T.T.1
Ong, C.W.2
-
12
-
-
0041743990
-
Electrical characterization of AlN MIS and MIM structures
-
F. Engelmark, J. Westlinder, G.F. Iriarte, I.V. Katardjiev, and J. Olsson. "Electrical characterization of AlN MIS and MIM structures," IEEE Trans. Electr. Dev., 50, 1214-9 (2003)
-
(2003)
IEEE Trans. Electr. Dev.
, vol.50
, pp. 1214-1219
-
-
Engelmark, F.1
Westlinder, J.2
Iriarte, G.F.3
Katardjiev, I.V.4
Olsson, J.5
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