Conduction and trapping of electric charges in an anisotropic material after irradiation with an electron beam: Application to TiO2 single-crystal

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 245, Issue 2, 2006, Pages 519-527

  Temga, T ^a   Juve D ^a   Treheux D ^a   Guerret Piecourt C ^b   Jardin, C ^c  

^a LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

^b UNIVERSITÉ DE PAU ET DES PAYS DE L'ADOUR   (France)

^c UNIVERSITÉ LYON 1   (France)

Author keywords

Anisotropic material; Charge effects; Electron beam irradiated area; TiO2; Trapping

Indexed keywords

ANISOTROPY; CRYSTAL ORIENTATION; ELECTRON BEAMS; ELECTRON TRAPS; IRRADIATION; PARTICLE BEAM INJECTION; SCANNING ELECTRON MICROSCOPY; TITANIUM DIOXIDE;

ANISOTROPIC MATERIAL; CHARGE EFFECTS; ELECTRON BEAM IRRADIATED AREA; TRAPPING;

ELECTRIC CHARGE;

EID: 33644750335     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.11.151     Document Type: Article

References (25)

1. R.A. Parker Phys. Rev. 124 1961 1719
2. G. Blaise, and W.J. Sarjeant IEEE Trans. Dielectr. Electr. Insul. 5 1998 779
3. E.G. Moya, F. Moya, A. Ahmed, J. Bigarré, D. Juvé, C. Jardin, IEEE Annual Rep. Conf. Dielec. Insul. Dielec. Phenom., Vol. 1, 1996, p. 98.
4. J. Vallayer, C. Jardin, and D. Treheux Opt. Mater. 16 2001 329
5. B.J. Hockey J. Am. Ceram. Soc. 54 1971 223
6. X.F. Zong, C.P. Shen, S. Liu, Y. Chen, and R. Zhang Phys. Rev. B 54 1996 139
7. B. Vallayer, G. Blaise, and D. Treheux Rev. Sci. Instr. 70 1999 3102
8. G. Blaise, CEIDP, IEEE Annual Rep. Conf. Dielec. Insul. Dielec. Phenom., 1993, p. 98.
9. J. Bigarré, C. Attard, P. Hourquebie, and J. Matallana IEEE Trans. Dielectr. Electr. Insul. 8 2001 942
10. C. Attard, J. Bigarré, P. Hourquebie, in: Proceedings of the 2nd Conference on Electrostatics, Montpellier, 2000, p. 77.
11. A. Berroug, J. Bigarré, S. Fayeulle, D. Tréheux, IEEE Annual Report Conf. on Dielec. Insul. and Dielec. Phenom., 1997, p. 97.
12. M. Belhaj, O. Jbara, M.N. Filippov, E.I. Rau, and M.V. Andrianov Appl. Surf. Sci. 17 2001 58
13. H. Gong, C. Le Gressus, K.H. Oh, X.Z. Ong, and B.T.G. Tan J. Appl. Phys. 74 1993 1944
14. J. Taniguchi, I. Miyamoto, N. Ohno, and S. Honda Nucl. Instr. and Meth. B 121 1997 507
15. R. Pantel, F. D'Avitaya, P. Ged, D. Bois, in: Proceedings of the SEM Symposium 1982, Scanning Microscopy International Chicago, 1982, p. 507.
16. H.J. Fitting, private communication.
17. R. Könenkamp Phys. Rev. B 61 2000 11057
18. R. Plugaru, A. Cremades, and J. Piqueras J. Phys.: Condens. Matter 16 2004 S261
19. N. Yu, and W.J. Halley Phys. Rev. B 51 1995 4768
20. J.W. Halley, M. Kozlowski, M. Michalewicz, W. Smyrl, and N. Tit Surf. Sci. 256 1991 397
21. P. Hasen Phys. Stat. Sol. 28 1975 145
22. R.W. Whiteworth Adv. Phys. 24 1975 235
23. H.J. Fitting, H. Glaefeke, and W. Wild Surf. Sci. 78 1978 267
24. P.W. Tasker J. Phys. C: Solid State Phys. 12 1979 4977
25. C. Le Gressus, and G. Blaise J. Electron Spectrosc. Relat. Phenom. 59 1992 73