SEM-mirror methods and application to insulator characterization

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 8, Issue 6, 2001, Pages 942-952

  Bigarre J ^a   Attard, C ^a   Hourquebie, P ^a   Matallana, J ^a  

^a CEA LE RIPAULT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CHARGE MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRIC SPACE CHARGE; MONTE CARLO METHODS; NONDESTRUCTIVE EXAMINATION; SCANNING ELECTRON MICROSCOPY;

CHARGE TRAPPING; SCANNING ELECTRON MICROSCOPY MIRROR METHOD;

ELECTRIC INSULATORS;

EID: 0035693781     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.971450     Document Type: Article

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