Standards for space charge characterization techniques

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 1996, Pages 98-101

  Moya Gontier, E G ^a   Moya, F ^a   Si Ahmed, A ^a   Bigarre, J ^a   Juve, D ^a   Jardin, C ^a  

^a Lab SERMEC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CATHODOLUMINESCENCE; DIELECTRIC PROPERTIES OF SOLIDS; DISLOCATIONS (CRYSTALS); ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; POLISHING; SAPPHIRE; SCANNING ELECTRON MICROSCOPY;

CHARGE TRAPPING; MIRROR METHOD; TRAP ANNIHILATION;

ELECTRIC SPACE CHARGE;

EID: 0030400672     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)