-
1
-
-
0036507014
-
-
E. G. Gamaly, A. V. Rode, B. Luther-Davies, and V. T. Tikhonchuk, Phys. Plasmas 9, 949 (2002).
-
(2002)
Phys. Plasmas
, vol.9
, pp. 949
-
-
Gamaly, E.G.1
Rode, A.V.2
Luther-Davies, B.3
Tikhonchuk, V.T.4
-
2
-
-
0028766486
-
-
D. Du, X. Liu, G. Korn, J. Squier, and G. Mourou, Appl. Phys. Lett. 64, 3071 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 3071
-
-
Du, D.1
Liu, X.2
Korn, G.3
Squier, J.4
Mourou, G.5
-
3
-
-
0032026862
-
-
D. Ashkenasi, H. Varel, A. Rosenfeld, S. Henz, J. Hermann, and E. E. B. Campbell, Appl. Phys. Lett. 72, 1442 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 1442
-
-
Ashkenasi, D.1
Varel, H.2
Rosenfeld, A.3
Henz, S.4
Hermann, J.5
Campbell, E.E.B.6
-
7
-
-
0036624371
-
-
S. K. Ahn, J. G. Kim, V. Perez-Mendez, S. Chang, K. H. Jackson, J. A. Kadyk, W. A. Wenzel, and G. Cho, IEEE Trans. Nucl. Sci. 49, 870 (2002).
-
(2002)
IEEE Trans. Nucl. Sci.
, vol.49
, pp. 870
-
-
Ahn, S.K.1
Kim, J.G.2
Perez-Mendez, V.3
Chang, S.4
Jackson, K.H.5
Kadyk, J.A.6
Wenzel, W.A.7
Cho, G.8
-
8
-
-
0036321703
-
-
10.1016/S1388-2481(02)00369-7
-
K. Yunus, C. B. Marks, A. C. Fisher, D. W. E. Allsopp, T. J. Ryan, R. A. W. Dryfe, S. S. Hill, E. P. L. Roberts, and C. M. Brennan, Electrochem. Commun. 10.1016/S1388-2481(02)00369-7 4, 579 (2002).
-
(2002)
Electrochem. Commun.
, vol.4
, pp. 579
-
-
Yunus, K.1
Marks, C.B.2
Fisher, A.C.3
Allsopp, D.W.E.4
Ryan, T.J.5
Dryfe, R.A.W.6
Hill, S.S.7
Roberts, E.P.L.8
Brennan, C.M.9
-
9
-
-
33644666137
-
-
Q. H. Wang, A. A. Setlur, J. M. Lauerhass, J. Y. Dai, E. W. Seelig, and R. P. H. Chang, Appl. Phys. Lett. 72, 579 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 579
-
-
Wang, Q.H.1
Setlur, A.A.2
Lauerhass, J.M.3
Dai, J.Y.4
Seelig, E.W.5
Chang, R.P.H.6
-
10
-
-
0030156581
-
-
A. Ruf, J. Diebel, M. Abraham, T. R. Dietrich, and M. Lacher, J. Micromech. Microeng. 6, 254 (1996).
-
(1996)
J. Micromech. Microeng.
, vol.6
, pp. 254
-
-
Ruf, A.1
Diebel, J.2
Abraham, M.3
Dietrich, T.R.4
Lacher, M.5
-
11
-
-
0034497918
-
-
H. Helvajian, P. D. Fuqua, W. W. Hansen, and S. Janson, Proc. SPIE 4088, 319 (2000).
-
(2000)
Proc. SPIE
, vol.4088
, pp. 319
-
-
Helvajian, H.1
Fuqua, P.D.2
Hansen, W.W.3
Janson, S.4
-
12
-
-
33644697619
-
-
T. R. Dietrich, W. Ehrfeld, M. Lacher, M. Krämer, and B. Speit, Microelectron. Eng. 30, 504 (1996).
-
(1996)
Microelectron. Eng.
, vol.30
, pp. 504
-
-
Dietrich, T.R.1
Ehrfeld, W.2
Lacher, M.3
Krämer, M.4
Speit, B.5
-
13
-
-
0034448211
-
-
P. D. Fuqua, D. P. Taylor, H. Helvajian, W. W. Hansen, and M. H. Abraham, Mater. Res. Soc. Symp. Proc. 624, 79 (2000).
-
(2000)
Mater. Res. Soc. Symp. Proc.
, vol.624
, pp. 79
-
-
Fuqua, P.D.1
Taylor, D.P.2
Helvajian, H.3
Hansen, W.W.4
Abraham, M.H.5
-
15
-
-
0033353259
-
-
Y. Kondo, J. Qiu, T. Mitsuyu, K. Hirao, and T. Yoko, Jpn. J. Appl. Phys., Part 2 38, L1146 (1999).
-
(1999)
Jpn. J. Appl. Phys., Part 2
, vol.38
, pp. 1146
-
-
Kondo, Y.1
Qiu, J.2
Mitsuyu, T.3
Hirao, K.4
Yoko, T.5
-
16
-
-
0031676684
-
-
Y. Kondo, T. Suzuki, H. Inouye, K. Miura, T. Mitsuyu, and K. Hirao, Jpn. J. Appl. Phys., Part 2 37, L94 (1998).
-
(1998)
Jpn. J. Appl. Phys., Part 2
, vol.37
, pp. 94
-
-
Kondo, Y.1
Suzuki, T.2
Inouye, H.3
Miura, K.4
Mitsuyu, T.5
Hirao, K.6
-
17
-
-
0037217029
-
-
Y. Cheng, K. Sugioka, K. Midorikawa, M. Masuda, K. Toyoda, M. Kawachi, and K. Shihoyama, Opt. Lett. 28, 55 (2003).
-
(2003)
Opt. Lett.
, vol.28
, pp. 55
-
-
Cheng, Y.1
Sugioka, K.2
Midorikawa, K.3
Masuda, M.4
Toyoda, K.5
Kawachi, M.6
Shihoyama, K.7
-
18
-
-
0038339015
-
-
Y. Cheng, K. Sugioka, M. Masuda, K. Shihoyama, K. Toyoda, and K. Midorikawa, Opt. Lett. 28, 1144 (2003).
-
(2003)
Opt. Lett.
, vol.28
, pp. 1144
-
-
Cheng, Y.1
Sugioka, K.2
Masuda, M.3
Shihoyama, K.4
Toyoda, K.5
Midorikawa, K.6
-
20
-
-
0037357191
-
-
M. Masuda, K. Sugioka, Y. Cheng, N. Aoki, M. Kawachi, K. Shihoyama, K. Toyoda, H. Helvajian, and K. Midorikawa, Appl. Phys. A: Mater. Sci. Process. 76, 857 (2003).
-
(2003)
Appl. Phys. A: Mater. Sci. Process.
, vol.76
, pp. 857
-
-
Masuda, M.1
Sugioka, K.2
Cheng, Y.3
Aoki, N.4
Kawachi, M.5
Shihoyama, K.6
Toyoda, K.7
Helvajian, H.8
Midorikawa, K.9
-
21
-
-
0141568001
-
-
M. Meunier, B. Fisette, A. Houle, A. V. Kabashin, S. V. Broude, and P. Miller, Proc. SPIE 4978, 169 (2003).
-
(2003)
Proc. SPIE
, vol.4978
, pp. 169
-
-
Meunier, M.1
Fisette, B.2
Houle, A.3
Kabashin, A.V.4
Broude, S.V.5
Miller, P.6
-
23
-
-
1842586802
-
-
M. Masuda, K. Sugioka, Y. Cheng, T. Hongo, K. Shihoyama, H. Takai, I. Miyamoto, and K. Midorikawa, Appl. Phys. A: Mater. Sci. Process. 78, 1029 (2004).
-
(2004)
Appl. Phys. A: Mater. Sci. Process.
, vol.78
, pp. 1029
-
-
Masuda, M.1
Sugioka, K.2
Cheng, Y.3
Hongo, T.4
Shihoyama, K.5
Takai, H.6
Miyamoto, I.7
Midorikawa, K.8
-
24
-
-
20444455029
-
-
T. Hongo, K. Sugioka, H. Niino, Y. Cheng, M. Masuda, I. Miyamoto, H. Takai, and K. Midorikawa, J. Appl. Phys. 97, 63517 (2005).
-
(2005)
J. Appl. Phys.
, vol.97
, pp. 63517
-
-
Hongo, T.1
Sugioka, K.2
Niino, H.3
Cheng, Y.4
Masuda, M.5
Miyamoto, I.6
Takai, H.7
Midorikawa, K.8
-
25
-
-
0032690669
-
-
Y. Kondo, K. Miura, T. Suzuki, H. Inouye, T. Mitsuyu, and K. Hirao, J. Non-Cryst. Solids 253, 143 (1999).
-
(1999)
J. Non-Cryst. Solids
, vol.253
, pp. 143
-
-
Kondo, Y.1
Miura, K.2
Suzuki, T.3
Inouye, H.4
Mitsuyu, T.5
Hirao, K.6
-
26
-
-
0012484265
-
-
Y. Kondo, H. Inouye, S. Fujiwara, T. Suzuki, T. Mitsuyu, T. Yoko, and K. Hirao, J. Appl. Phys. 88, 1244 (2000).
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 1244
-
-
Kondo, Y.1
Inouye, H.2
Fujiwara, S.3
Suzuki, T.4
Mitsuyu, T.5
Yoko, T.6
Hirao, K.7
-
28
-
-
0004217652
-
-
2nd ed. (Wiley, New York
-
W. D. Kingery, H. K. Bowen, and D. R. Uhlmann, Introduction to Ceramics, 2nd ed. (Wiley, New York, 1976), p. 1032.
-
(1976)
Introduction to Ceramics
, pp. 1032
-
-
Kingery, W.D.1
Bowen, H.K.2
Uhlmann, D.R.3
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