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Volumn 49 II, Issue 3, 2002, Pages 870-874

GEM-type detectors using LIGA and etchable glass technologies

Author keywords

Radiation detector

Indexed keywords

COPPER; ELECTRODES; ELECTRON MULTIPLIERS; ETCHING; POLYMETHYL METHACRYLATES; SYNCHROTRON RADIATION; ULTRAVIOLET RADIATION; X RAY LITHOGRAPHY;

EID: 0036624371     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.1039581     Document Type: Article
Times cited : (11)

References (8)
  • 1
    • 0031074683 scopus 로고    scopus 로고
    • GEM: A new concept for electron amplification in gas detectors
    • F. Sauli, "GEM: A new concept for electron amplification in gas detectors," Nucl. Instrum. Meth., vol A386, pp. 531-534, 1997.
    • (1997) Nucl. Instrum. Meth. , vol.A386 , pp. 531-534
    • Sauli, F.1
  • 2
    • 0033285206 scopus 로고    scopus 로고
    • Development and operation of laser machined microwell detectors
    • W. K. Pitts et al., "Development and operation of laser machined microwell detectors," Nucl. Instrum. Methods, vol. A438, p. 277, 1999.
    • (1999) Nucl. Instrum. Methods , vol.A438 , pp. 277
    • Pitts, W.K.1
  • 3
    • 0034205852 scopus 로고    scopus 로고
    • Application of the LIGA process for fabrication of gas avalanche devices
    • June
    • H. K. Kim et al., "Application of the LIGA process for fabrication of gas avalanche devices," IEEE Trans. Nucl. Sci., vol. 47, pp. 923-927, June 2000.
    • (2000) IEEE Trans. Nucl. Sci. , vol.47 , pp. 923-927
    • Kim, H.K.1
  • 5
    • 0005472887 scopus 로고    scopus 로고
    • Factors influencing damascene feature fill using copper PVD and electroplating
    • Novellus Systm. Inc. [Online]
    • J. Reid, S. Mayer, E. Broadbent, E. Klawuhn, K. Ashtiani, and Novellus Systems. Factors influencing damascene feature fill using copper PVD and electroplating. Novellus Syst. Inc. [Online]. Available: Tech. Rep. http://www.novellus.com/Damascus/tec/tec_20.asp
    • Reid, J.1    Mayer, S.2    Broadbent, E.3    Klawuhn, E.4    Ashtiani, K.5
  • 6
    • 0011219699 scopus 로고    scopus 로고
    • Palladium-tin catalyst and LC electroless copper process, M&T Chemicals Inc., Rahway, NJ, Tech. Rep.
    • Palladium-tin catalyst and LC electroless copper process, M&T Chemicals Inc., Rahway, NJ, Tech. Rep.
  • 7
    • 0033321116 scopus 로고    scopus 로고
    • GEM: Performance and aging tests
    • June
    • H. S. Cho et al., "GEM: Performance and aging tests," IEEE Trans. Nucl. Sci., vol. 46, pp. 306-311, June 1999.
    • (1999) IEEE Trans. Nucl. Sci. , vol.46 , pp. 306-311
    • Cho, H.S.1
  • 8
    • 0032290016 scopus 로고    scopus 로고
    • What is the real gas gain of a standard GEM?
    • R. Bellazzini et al., "What is the real gas gain of a standard GEM?," Nucl. Instrum. Methods, vol. A419, pp. 429-437, 1998.
    • (1998) Nucl. Instrum. Methods , vol.A419 , pp. 429-437
    • Bellazzini, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.