Asymmetric fingered TFT structure: A new architecture for kink effect and off-current suppression and improved stability

Journal of the Korean Physical Society

Volumn 48, Issue SUPPL. 1, 2006, Pages

  Fortunato, G ^a   Cuscuna M ^a   Mariucci, L ^a   Bonfiglietti, A ^a   Pecora, A ^a   Valletta, A ^a  

^a IFN CNR   (Italy)

Author keywords

Hot carrier induced degradation; Kink Effect; Off current; Polysilicon TFTs

Indexed keywords

EID: 33644555831     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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