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Volumn 48, Issue SUPPL. 1, 2006, Pages
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Contact characteristics of silicon and Indium Tin Oxide (ITO) in polysilicon thin-film transistors
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Author keywords
Contact resistance; Indium tin oxide; Polycrystalline silicon TFT
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Indexed keywords
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EID: 33644525673
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (18)
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