메뉴 건너뛰기




Volumn 48, Issue SUPPL. 1, 2006, Pages

Contact characteristics of silicon and Indium Tin Oxide (ITO) in polysilicon thin-film transistors

Author keywords

Contact resistance; Indium tin oxide; Polycrystalline silicon TFT

Indexed keywords


EID: 33644525673     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.