Energy loss spectroscopic profiling across linear interfaces: The example of amorphous carbon superlattices

Ultramicroscopy

Volumn 106, Issue 4-5, 2006, Pages 346-355

  Stolojan, V ^a   Moreau, P ^b   Henley, S J ^a   Goringe, M J ^a   Silva, S R P ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

Amorphous carbon superlattice; Dielectric interface; EELS; ELSP; Localization inelastic scattering

Indexed keywords

AMORPHOUS MATERIALS; CARBON; ENERGY GAP; INTERFACES (MATERIALS); SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS CARBON SUPERLATTICE; DIELECTRIC INTERFACE; ELSP; LOCALIZATION INELASTIC SCATTERING;

ELECTRON ENERGY LOSS SPECTROSCOPY;

CARBON;

ARTICLE; COLORIMETRY; ELECTRON; ENERGY; IMAGE DISPLAY; INFRARED SPECTROSCOPY; OPTICAL RESOLUTION; PARAMETER;

EID: 33644499836     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.11.004     Document Type: Article

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