Imaging defects and dopants

Materials Today

Volumn 6, Issue 6, 2003, Pages 36-43

  Ebert, H Philipp ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CHEMICAL BONDS; DOPING (ADDITIVES); IONIZATION; NEGATIVE IONS; POINT DEFECTS;

DOPANTS;

SCANNING TUNNELING MICROSCOPY;

EID: 0041672517     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(03)00632-1     Document Type: Article

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