The influence of diffusion-induced dislocations on high efficiency silicon solar cells

IEEE Transactions on Electron Devices

Volumn 53, Issue 3, 2006, Pages 457-464

  Cousins, Peter J ^a   Cotter, Jeffrey E ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Circuit analysis; Diffusion processes; Losses; Photovoltaic cells; Silicon

Indexed keywords

CRYSTAL DEFECTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC LOSSES; ELECTRIC NETWORK ANALYSIS; PHOTOVOLTAIC CELLS; SEMICONDUCTING BORON;

DIFFUSION PROCESSES; DISLOCATION NETWORKS; HEAVY BORON; LOCALIZED CONTACT DIFFUSIONS; MONOCRYSTALLINE SILICON SOLAR CELL; PHOSPHORUS DIFFUSIONS;

SILICON SOLAR CELLS;

EID: 33244478754     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.863535     Document Type: Article

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