Application of junction capacitance measurements to the characterization of solar cells

IEEE Transactions on Electron Devices

Volumn 53, Issue 3, 2006, Pages 442-448

  Recart, Federico ^a,b   Cuevas, Andrés ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b Instituto de Tecnologia Microelectronica   (Spain)

Author keywords

Capacitance; Photovoltaic cells; Space charge region (SCR)

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; PHOTOVOLTAIC CELLS; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS; SUBSTRATES;

CAPACITANCE-VOLTAGE (C-V); EMITTER DOPING; JUNCTION CAPACITANCE; RESISTIVITY SUBSTRATES; SPACE CHARGE REGION (SCR);

SOLAR CELLS;

EID: 33244474412     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.870846     Document Type: Article

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