Study of the relation between doping profile and diode CV characteristics

IEEE Transactions on Microwave Theory and Techniques

Volumn 47, Issue 4, 1999, Pages 506-509

  Salameh, Daoud ^a   Linton, David ^a  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; CURVE FITTING; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT LAYOUT; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS;

SOFTWARE PACKAGE HP-MDS;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0032655447     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.754885     Document Type: Article

References (13)

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