Surface states and annihilation characteristics of positrons trapped at reconstructed semiconductor surfaces

Applied Surface Science

Volumn 252, Issue 9, 2006, Pages 3333-3341

  Fazleev, N G ^a,b  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^b KAZAN STATE UNIVERSITY   (Russian Federation)

Author keywords

Annihilation; Localization; Positron; Reconstruction; Silicon; Surface

Indexed keywords

BINDING ENERGY; SILICON; SUPERCONDUCTIVITY; SURFACE CHEMISTRY;

ANNIHILATION; LOCALIZATION; RECONSTRUCTION; SURFACE;

POSITRON ANNIHILATION SPECTROSCOPY;

EID: 32644459569     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.08.082     Document Type: Article

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