Contrast in scanning probe microscopy images of ultrathin insulator films

Applied Physics Letters

Volumn 88, Issue 6, 2006, Pages

  Klust, Andreas ^a,e   Yu, Qiuming ^a   Olmstead, Marjorie A ^a   Ohta, Taisuke ^b,f   Ohuchi, Fumio S ^b   Bierkandt, Markus ^c   Deiter, Carsten ^d   Wollschläger, Joachim ^d  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

^c LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^d UNIVERSITY OF OSNABRÜCK   (Germany)

^e Stanford University   (United States)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS VOLTAGE; SCANNING PROBE MICROSCOPY;

IMAGING TECHNIQUES; INSULATING MATERIALS; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; SCANNING TUNNELING MICROSCOPY;

ULTRATHIN FILMS;

EID: 32544446017     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2172397     Document Type: Review

References (21)

1. S. Schintke and W.-D. Schneider, J. Phys.: Condens. Matter 16, R49 (2004).
2. L. J. Schowalter and R. W. Fathauer, CRC Crit. Rev. Solid State Mater. Sci. 15, 367 (1989).
3. M. A. Olmstead, Thin Films: Heteroepitaxial Systems (World Scientific, Singapore, 1999), Chap. 5, Ca F2 Si (111), pp. 211-266.
4. R. M. Tromp and M. C. Reuter, Phys. Rev. Lett. 61, 1756 (1988).
5. A. Klust, M. Bierkandt, J. Wollschläger, B. H. Müller, T. Schmidt, and J. Falta, Phys. Rev. B 65, 193404 (2002).
6. J. Viernow, D. Y. Petrovykh, A. Kirakosian, J.-L. Lin, F. K. Men, M. Henzler, and F. J. Himpsel, Phys. Rev. B 59, 10356 (1999).
7. P. Avouris and R. Wolkow, Appl. Phys. Lett. 55, 1074 (1989).
8. T. Sumiya, T. Miura, and S. Tanaka, Surf. Sci. 357-358, 896 (1996).
9. K. Kametani, K. Sudoh, and H. Iwasaki, Jpn. J. Appl. Phys., Part 1 41, 250 (2002).
10. A. Klust, H. Pietsch, and J. Wollschläger, Appl. Phys. Lett. 73, 1967 (1998).
11. U. Hessinger, M. Leskovar, and M. A. Olmstead, Phys. Rev. Lett. 75, 2380 (1995).
12. A. Klust, R. Kayser, and J. Wollschläger, Phys. Rev. B 62, 2158 (2000).
13. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
14. M. Guggisberg, M. Bammerlin, R. Lüthi, C. Loppacher, F. Battiston, J. Lü, A. Baratoff, E. Meyer, and H.-J. Güntherodt, Appl. Phys. A A66, S245 (1998).
15. N. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
16. J. Lü, M. Guggisberg, R. Lüthi, M. Kubon, L. Scandella, C. Gerber, E. Meyer, and H.-J. Güntherodt, Appl. Phys. A A66, S273 (1998).
17. M. Guggisberg, M. Bammerlin, C. Loppacher, O. Pfeiffer, A. Abdurixit, V. Barwich, R. Bennewitz, A. Baratoff, E. Meyer, and H.-J. Güntherodt, Phys. Rev. B 61, 11151 (2000).
18. W. Denk and D. W. Pohl, Appl. Phys. Lett. 59, 2171 (1991).
19. C. Hagendorf, R. Shantyr, K. Meinel, K.-M. Schindler, and H. Neddermeyer, Surf. Sci. 532-535, 346 (2003).
20. M. A. Olmstead, R. I. G. Uhrberg, R. D. Bringans, and R. Z. Bachrach, Phys. Rev. B 35, 7526 (1987).
21. C. Niu, N. P. Magtoto, and J. A. Kelber, J. Vac. Sci. Technol. A 19, 1947 (2001).