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Volumn 22, Issue 3, 2004, Pages 1273-1276

Microelectron field emitter array with focus lenses for multielectron beam lithography based on silicon on insulator wafer

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; DIAMONDS; ELECTRODES; FINITE ELEMENT METHOD; ION BEAM LITHOGRAPHY; MICROELECTRONICS; OXIDATION; PHOSPHORS; SCANNING TUNNELING MICROSCOPY; SILICON ON INSULATOR TECHNOLOGY; SUBSTRATES; THERMAL EFFECTS;

EID: 3242739372     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (22)

References (18)
  • 1
    • 3242711986 scopus 로고    scopus 로고
    • California, August (unpublished)
    • For example, Proceedings of the 14th International Vacuum Microelectronics Conference, California, August 2001 (unpublished); Proceedings of the 15th International Vacuum Microelectronics Conference & 48th International Field Emission Symposium, Lyon-France, July 2002 (unpublished); Proceedings of the 16th International Vacuum Microelectronics Conference, Osaka, Japan, July 2003 (unpublished).
    • (2001) Proceedings of the 14th International Vacuum Microelectronics Conference
  • 3
    • 3242658817 scopus 로고    scopus 로고
    • Osaka, Japan, July (unpublished)
    • For example, Proceedings of the 14th International Vacuum Microelectronics Conference, California, August 2001 (unpublished); Proceedings of the 15th International Vacuum Microelectronics Conference & 48th International Field Emission Symposium, Lyon-France, July 2002 (unpublished); Proceedings of the 16th International Vacuum Microelectronics Conference, Osaka, Japan, July 2003 (unpublished).
    • (2003) Proceedings of the 16th International Vacuum Microelectronics Conference


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.