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Volumn 44, Issue 24-27, 2005, Pages

Recovery from dry etching damage in ZnTe by thermal annealing

Author keywords

Reactive ion etching; Recovery; Surface damage; Thermal annealing; Zinc telluride

Indexed keywords

ANNEALING; REACTIVE ION ETCHING; RECOVERY;

EID: 32044456456     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.L863     Document Type: Article
Times cited : (2)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.