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Volumn 55, Issue 1, 2006, Pages 273-279

A new configuration of nematic liquid crystal thermography with applications to GaN-based devices

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT TRANSISTORS; HEAT RESISTANCE; HETEROJUNCTIONS; LIGHT EMITTING DIODES; LIGHT REFLECTION; SEMICONDUCTING GALLIUM COMPOUNDS; SILICON CARBIDE; SUBSTRATES; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 32044448969     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.861243     Document Type: Article
Times cited : (8)

References (12)
  • 2
    • 0036639037 scopus 로고    scopus 로고
    • "Optical study of high-biased AlGaN/GaN high-electron-mobility transistors"
    • Jul
    • N. Shigekawa, K. Shiojima, and T. Suemitsu, "Optical study of high-biased AlGaN/GaN high-electron-mobility transistors," J. Appl. Phys., vol. 92, no. 1, pp. 531-535, Jul. 2002.
    • (2002) J. Appl. Phys. , vol.92 , Issue.1 , pp. 531-535
    • Shigekawa, N.1    Shiojima, K.2    Suemitsu, T.3
  • 3
    • 0027646267 scopus 로고
    • "Precision comparison of surface temperature measurement techniques for GaAs IC's"
    • Aug
    • M. Nishiguchi, M. Fujihara, A. Miki, and H. Nishizawa, "Precision comparison of surface temperature measurement techniques for GaAs IC's," IEEE Trans. Compon. Hybrids Manuf. Technol., vol. 16, no. 5, pp. 543-549, Aug. 1993.
    • (1993) IEEE Trans. Compon. Hybrids Manuf. Technol. , vol.16 , Issue.5 , pp. 543-549
    • Nishiguchi, M.1    Fujihara, M.2    Miki, A.3    Nishizawa, H.4
  • 4
    • 1542314472 scopus 로고
    • "A surface temperature limit detector using nematic liquid crystals with an application to microcircuits"
    • Aug
    • C. E. Steohens and F. N. Sinnadurai, "A surface temperature limit detector using nematic liquid crystals with an application to microcircuits," J. Phys. E Sci. Instrum., vol. 7, no. 8, pp. 641-643, Aug. 1974.
    • (1974) J. Phys. E Sci. Instrum. , vol.7 , Issue.8 , pp. 641-643
    • Steohens, C.E.1    Sinnadurai, F.N.2
  • 5
    • 0002736342 scopus 로고
    • "Dynamic liquid crystal hot spot examination of functional failures on production testers"
    • Santa Clara, CA
    • H. Lin, M. Khan, and T. Giao, "Dynamic liquid crystal hot spot examination of functional failures on production testers," in Proc. 20th Int. Symp. Testing and Failure Analysis, Santa Clara, CA, 1994, pp. 81-85.
    • (1994) Proc. 20th Int. Symp. Testing and Failure Analysis , pp. 81-85
    • Lin, H.1    Khan, M.2    Giao, T.3
  • 6
    • 0041385878 scopus 로고    scopus 로고
    • "Thermal modeling and measurement of GaN-based HFET devices"
    • Jul
    • J. Park, M. W. Shin, and C. C. Lee, "Thermal modeling and measurement of GaN-based HFET devices," IEEE Electron Device Lett., vol. 24, no. 7, pp. 424-426, Jul. 2003.
    • (2003) IEEE Electron Device Lett. , vol.24 , Issue.7 , pp. 424-426
    • Park, J.1    Shin, M.W.2    Lee, C.C.3
  • 7
    • 8144230248 scopus 로고    scopus 로고
    • "Thermal modeling and measurement of AlGaN/GaN HFETs built on sapphire and SiC substrates"
    • Nov
    • J. Park, M. W. Shin, and C. C. Lee, "Thermal modeling and measurement of AlGaN/GaN HFETs built on sapphire and SiC substrates," IEEE Trans. Electron Devices, vol. 51, no. 11, pp. 1753-1759, Nov. 2004.
    • (2004) IEEE Trans. Electron Devices , vol.51 , Issue.11 , pp. 1753-1759
    • Park, J.1    Shin, M.W.2    Lee, C.C.3
  • 8
    • 9144253970 scopus 로고    scopus 로고
    • "Temperature profiles measurement on visible light emitting diodes using nematic liquid crystal and IR laser"
    • Nov
    • J. Park, M. W. Shin, and C. C. Lee, "Temperature profiles measurement on visible light emitting diodes using nematic liquid crystal and IR laser," Opt. Lett., vol. 29, no. 22, pp. 2656-2658, Nov. 2004.
    • (2004) Opt. Lett. , vol.29 , Issue.22 , pp. 2656-2658
    • Park, J.1    Shin, M.W.2    Lee, C.C.3
  • 9
    • 0038713997 scopus 로고    scopus 로고
    • 1st ed. Upper Saddle River, NJ: Prentice-Hall
    • S. O. Kasap, Optoelectronics and Photonics, 1st ed. Upper Saddle River, NJ: Prentice-Hall, 2001, p. 281.
    • (2001) Optoelectronics and Photonics , pp. 281
    • Kasap, S.O.1
  • 10
    • 0038758336 scopus 로고    scopus 로고
    • 3rd ed. Reading, MA: Addison-Wesley
    • E. Hecht, Optics, 3rd ed. Reading, MA: Addison-Wesley, 1998, p. 347.
    • (1998) Optics , pp. 347
    • Hecht, E.1
  • 11
    • 0031247862 scopus 로고    scopus 로고
    • "High power applications for GaN-based devices"
    • Oct
    • R. J. Trew, M. W. Shin, and V. Gatto, "High power applications for GaN-based devices," Solid State Electron., vol. 41, no. 10, pp. 1561-1567, Oct. 1997.
    • (1997) Solid State Electron , vol.41 , Issue.10 , pp. 1561-1567
    • Trew, R.J.1    Shin, M.W.2    Gatto, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.