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Volumn 44, Issue 7 B, 2005, Pages 5556-5559

Novel evaluation system for extreme ultraviolet lithography resist in NewSUBARU

Author keywords

Chemically amplified resist; Exposure characteristics; Extreme ultraviolet lithography; Outgassing

Indexed keywords

DEGASSING; MASS SPECTROMETERS; SYNCHROTRON RADIATION; ULTRAVIOLET RADIATION;

EID: 31844454835     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.5556     Document Type: Article
Times cited : (35)

References (14)
  • 3
    • 0003779543 scopus 로고    scopus 로고
    • Microlithography, micromachining and microfabrication
    • ed. P. Rai-Choudhury
    • M. A. MaCord and M. J. Rooks: Microlithography, Micromachining and Microfabrication, Vol. 1; Microlithography, ed. P. Rai-Choudhury, p. 208.
    • Microlithography , vol.1 , pp. 208
    • Macord, M.A.1    Rooks, M.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.