Tip-enhanced Raman spectroscopy with high contrast

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5927, Issue , 2005, Pages 1-7

  Mehtani, D ^a   Lee, N ^a   Hartschuh, R D ^a   Kisliuk, A ^a   Foster, M D ^a   Sokolov, A P ^a   Maguire, J F ^b  

^a University of Akron   (United States)

^b WRIGHT PATTERSON AIR FORCE BASE   (United States)

Author keywords

(100) Silicon; Contrast; Polarization of light; Side illumination geometry; Tip enhanced raman spectroscopy (TERS)

Indexed keywords

CONTRAST; SIDE-ILLUMINATION GEOMETRY; TIP-ENHANCED RAMAN SPECTROSCOPY;

COMPOSITION; LIGHT POLARIZATION; NANOSTRUCTURED MATERIALS; OPTIMIZATION; SILICON COMPOUNDS; STRESS ANALYSIS;

RAMAN SPECTROSCOPY;

EID: 31844451121     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.615335     Document Type: Conference Paper

References (28)

1. R. L. McCreery, Raman Spectroscopy for Chemical Analysis, Wiley Interscience, New York, 2000.
2. E. H. Synge, "A suggested method for extending microscopic resolution into the ultramicroscopic region", Phil. Mag., 6, 356-362, 1928.
3. C. L. Jahncke, M. A. Paesler, H. D. Hallen, "Raman imaging with near-field scanning optical microscopy", Appl. Phys. Lett., 17, 2483-2485, 1995.
4. S. Webster, D. N. Batchelder, D. A. Smith, "Submicron resolution measurement of stress in silicon by near-field Raman spectroscopy", Appl. Phys. Lett., 72, 1478-1480, 1998.
5. J. Wessel, "Surface-enhanced optical microscopy", Opt. Soc. Am. B, 2, 1538-1541, 1985.
6. M. Moskovits, "Surface-enhanced spectroscopy", Rev. Mod. Phys., 57, 783-826, 1985.
7. R. Stockle, Y. D. Suh, V. Deckert, R. Zenobi, "Nanoscale chemical analysis by tip-enhanced Raman spectroscopy", Chem. Phys. Lett., 318, 131-136, 2000.
8. N. Hayazawa, Y. Inouye. Z. Sekkat, S. Kawata, "Near-field Raman scattering enhanced by a metallized tip", Chem. Phys. Lett., 335, 369-374, 2001.
9. J. J. Wang, D. A. Smith, D. N. Batchelder, Y. Saito, J. Kirkham, C. Robinson, K. Baldwin, G. Li, B. Bennett, "Apertureless near-field Raman spectroscopy", J. Microsc., 210, 330-333, 2003.
10. A. Hartschuh, E. J. Sánchez, X. S. Xie, L. Novotny, "High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes", Phys. Rev. Lett., 90, 095503, 2003.
11. D. S. Bulgarevich, M. Futamata, "Apertureless tip-enhanced Raman microscopy with confocal epi-illumination optics", Appl. Spectrosc., 58, 757-761, 2004.
12. L. T. Nieman, G. M. Krampert, R. E. Martinez, "An apertureless near-field scanning optical microscope and its application to surface-enhanced Raman spectroscopy and multiphoton fluorescence imaging", Rev. Sci. Instrum., 72, 1691-1698, 2001.
13. B. Pettinger, G. Picardi, R. Schuster, G. Ertl, "Surface-enhanced and STM tip-enhanced Raman spectroscopy of CN- ions at gold surfaces", J. Electroanal. Chem., 554, 293-299, 2003.
14. N. Hayazawa, Y. Inouye, A. Tarun, S. Kawata, "Near-field enhanced Raman spectroscopy using side illumination optics", J. Appl. Phys., 92, 6983-6986, 2002.
15. M. S. Andersen, W. T. Pike, "A Raman-atomic force microscope for apertureless-near-field spectroscopy and optical trapping", Rev. Sci. Intrum., 73, 1198-1203, 2002.
16. B. Pettinger, B. Ren, G. Picardi, R. Schuster, G. Ertl, "Nanoscale probing of adsorbed species by tip-enhanced Raman spectroscopy", Phys. Rev. Lett., 92, 096101, 2004.
17. W. X. Sun, Z. X. Shen, "A practical nanoscopic Raman imaging technique realized by near-field enhancement", Mater. Phys. Mech., 4, 17-21, 2001.
18. V. Poborchii, T. Tada, T. Kanayama, "Subwavelength resolution Raman microscopy of Si structures using metal-particle-topped AFM probe", Japn. J. Appl. Phys., 44, L202-204, 2005.
19. D. Mehtani, N. Lee, R. D. Hartschuh, A. Kisliuk, M. D. Foster, A. P. Sokolov, J. F. Maguire, "Nano-Raman spectroscopy with side illumination optics", J. Raman Spectroscopy (in press).
20. O. J. F. Martin, C. Girard, "Controlling and tuning strong optical field gradients at a local probe microscope tip apex", Appl. Phys. Lett., 70, 705-707, 1997.
21. Z. C. Feng, A. J. Mascarenhas, W. J. Choyke, J. A. Powell, "Raman determination of layer stresses and strains for heterostructures and its application to the cubic SiC/Si system", J. Appl. Phys., 64, 6827-6835, 1988.
22. W. X. Sun, Z. X. Shen, "Apertureless near-field scanning Raman microscopy using reflection scattering geometry", Ultramicroscopy, 94, 237-244, 2003.
23. F. Demming, J. Jersch, K. Dickmann, P. I. Geshev, "Calculation of the field enhancement on laser-illuminated scanning probe tips by the boundary element method", Appl. Phys. B: Lasers Opt., 66, 593-598, 1998.
24. A. Hartschuh, M. R. Beversluis, A. Bouhelier, L. Novotny, "Tip-enhanced optical spectroscopy", Phil. Trans. R. Soc. Lond. A., 362, 807-819, 2004.
25. J. B. Hopkins, L. A. Farrow, "Raman microprobe determination of local crystal orientation", J. Appl. Phys., 59, 1103-1110, 1986.
26. S. Nakashima, K. Mizoguchi, "Determination of crystallographic orientations in silicon films by Raman-microprobe polarization measurements", J. Appl. Phys., 65, 2583-2590, 1989.
27. D. Mehtani, N. Lee, R. D. Hartschuh, A. Kisliuk, M. D. Foster, A. P. Sokolov, (to be published).
28. R. G. Milner, D. Richards, "The role of tip plasmons in near-field Raman microscopy", J. Microsc., 202, 66-71, 2001.