Apertureless near-field Raman spectroscopy

Journal of Microscopy

Volumn 210, Issue 3, 2003, Pages 330-333

  Wang, J J ^a,d   Smith, D A ^a   Batchelder, D N ^a   Saito, Y ^a   Kirkham, J ^b   Robinson, C ^b   Baldwin, K ^a   Li, G ^a   Bennett, B ^c  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b LEEDS DENTAL INSTITUTE   (United Kingdom)

^c RENISHAW PLC   (United Kingdom)

^d PEKING UNIVERSITY   (China)

Author keywords

AFM; Apertureless SNOM; C60; Raman

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSCOPES; RAMAN SPECTROSCOPY;

AFM; APERTURELESS SCANNING; APERTURELESS SNOM; ATOMIC FORCE; C60; NEAR-FIELD RAMAN SPECTROSCOPY; RAMAN; RAMAN SIGNAL; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; TOPOGRAPHIC INFORMATION;

GOLD COATINGS;

GOLD;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE INTENSIFIER; IMAGE QUALITY; IMAGING SYSTEM; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0038001502     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01166.x     Document Type: Article

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