Electrical properties and microstructures of sol-gel-deposited lead zirconate titanate thin films crystallized by 28 GHz microwave irradiation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 9 B, 2005, Pages 6914-6917

  Wang, Zhan Jie ^a   Kokawa, Hiroyuki ^a   Takizawa, Hirotsugu ^a   Ichiki, Masaaki ^b   Maeda, Ryutaro ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Electrical properties; Lead zirconate titanate (PZT); Microstructure; Microwave irradiation; Sol gel deposition

Indexed keywords

CRYSTALLIZATION; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; MICROSTRUCTURE; MICROWAVES; SCANNING ELECTRON MICROSCOPY; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

LEAD ZIRCONATE TITANATE (PZT); REMANENT POLARIZATION; SOL-GEL DEPOSITION;

LEAD COMPOUNDS;

EID: 31844450367     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.6914     Document Type: Article

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