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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 7 B, 2005, Pages 5413-5416

Structural stability of Si(001) and Ge(001) in external electric fields

(2) Nakamura, Jun a Natori, Akiko a

a UNIVERSITY OF ELECTRO COMMUNICATIONS (Japan)

Author keywords

Electric field; STM; Surface structure

Indexed keywords

ELECTRIC FIELDS; GERMANIUM; SCANNING TUNNELING MICROSCOPY; STABILITY; SURFACE STRUCTURE;

REHYBRIDIZATION; STM;

SILICON;

EID: 31844447933 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.44.5413 Document Type: Article

Times cited : (4)

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