Electric field effects on surface dynamics: Si ad-dimer diffusion and rotation on Si(0 0 1)

Surface Science

Volumn 536, Issue 1-3, 2003, Pages 121-129

  Mattsson, Thomas R ^a   Swartzentruber, B S ^a   Stumpf, Roland ^b   Feibelman, Peter J ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b MOTOROLA INC   (United States)

Author keywords

Density functional calculations; Scanning tunneling microscopy; Silicon; Surface diffusion

Indexed keywords

CRYSTAL ORIENTATION; DIFFUSION; DIMERS; ELECTRIC FIELD EFFECTS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA;

DENSITY FUNCTIONAL THEORY;

SEMICONDUCTING SILICON;

EID: 0037768661     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00565-X     Document Type: Article

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