Surface-state stark shift in a scanning tunneling microscope

Physical Review Letters

Volumn 91, Issue 19, 2003, Pages

  Limot, L ^a   Maroutian, T ^a   Johansson, P ^b   Berndt, R ^a  

^a UNIVERSITY OF KIEL   (Germany)

^b ÖREBRO UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ELECTRON ENERGY LEVELS; FREE ENERGY; LOW TEMPERATURE EFFECTS; MATHEMATICAL MODELS; MORPHOLOGY; SILVER; SPECTROSCOPIC ANALYSIS; SURFACES; TUNNEL JUNCTIONS;

PHOTOEMISSION SPECTROSCOPY; STARK EFFECT; STARK FREE ENERGY; SURFACE STATE BINDING ENERGY; SURFACE STATE STARKL SHIFT;

SCANNING TUNNELING MICROSCOPY;

EID: 0346846616     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.196801     Document Type: Article

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