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Volumn 91, Issue 10 I, 2002, Pages 8843-8845

Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUOUS FILMS; DETECTION SIGNAL; HIGHER RESOLUTION; MAGNETIC COATINGS; MULTIPLE LAYERS;

FERROMAGNETIC MATERIALS; FOCUSED ION BEAMS; MAGNETIC FORCE MICROSCOPY;

FERROMAGNETISM;

EID: 0037095279 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1456056 Document Type: Article

Times cited : (31)

References (13)

1
- 36549092318
- jaJAPIAU 0021-8979
- D. Rugar, J. Appl. Phys. 68, 1169 (1990). jap JAPIAU 0021-8979
- (1990) J. Appl. Phys. , vol.68 , pp. 1169
- Rugar, D.¹

2
- 24244448532
- prb PRBMDO 0163-1829
- A. Wadas, Phys. Rev. B 39, 12103 (1989). prb PRBMDO 0163-1829
- (1989) Phys. Rev. B , vol.39 , pp. 12103
- Wadas, A.¹

3
- 0031998892
- jmm JMMMDC 0304-8853
- S. Porthun, J. Magn. Magn. Mater. 182, 238 (1998). jmm JMMMDC 0304-8853
- (1998) J. Magn. Magn. Mater. , vol.182 , pp. 238
- Porthun, S.¹

4
- 0040289935
- apl APPLAB 0003-6951
- J. M. García, A. Thiaville, J. Miltat, K. J. Kirk, J. N. Chapman, and F. Alouges, Appl. Phys. Lett. 79, 656 (2001). apl APPLAB 0003-6951
- (2001) Appl. Phys. Lett. , vol.79 , pp. 656
- García, J.M.¹ Thiaville, A.² Miltat, J.³ Kirk, K.J.⁴ Chapman, J.N.⁵ Alouges, F.⁶

5
- 0033184248
- emg IEMGAQ 0018-9464
- S. H. Liou, IEEE Trans. Magn. 35, 3989 (1999). emg IEMGAQ 0018-9464
- (1999) IEEE Trans. Magn. , vol.35 , pp. 3989
- Liou, S.H.¹

6
- 0001359535
- apl APPLAB 0003-6951
- L. Folks, M. E. Best, P. M. Rice, B. D. Terris, D. Weller, and J. N. Chapman, Appl. Phys. Lett. 76, 909 (2000). apl APPLAB 0003-6951
- (2000) Appl. Phys. Lett. , vol.76 , pp. 909
- Folks, L.¹ Best, M.E.² Rice, P.M.³ Terris, B.D.⁴ Weller, D.⁵ Chapman, J.N.⁶

7
- 0001630861
- jaJAPIAU 0021-8979
- B. A. Gurney, V. S. Speriosu, D. R. Wilhoit, H. Lefakis, R. E. Fontana, Jr., D. E. Heim, and M. Dovek, J. Appl. Phys. 81, 3998 (1997). jap JAPIAU 0021-8979
- (1997) J. Appl. Phys. , vol.81 , pp. 3998
- Gurney, B.A.¹ Speriosu, V.S.² Wilhoit, D.R.³ Lefakis, H.⁴ Fontana Jr., R.E.⁵ Heim, D.E.⁶ Dovek, M.⁷

8
- 0000700321
- jaJAPIAU 0021-8979
- A. Maesaka, N. Sugawara, A. Okabe, and Massao Itabashi, J. Appl. Phys. 83, 7628 (1998). jap JAPIAU 0021-8979
- (1998) J. Appl. Phys. , vol.83 , pp. 7628
- Maesaka, A.¹ Sugawara, N.² Okabe, A.³ Itabashi, M.⁴

9
- 0000000386
- jvb JVTBD9 0734-211X
- M. J. Vasile, D. Grigg, J. E. Griffith, E. Fitzgerald, and P. E. Russell, J. Vac. Sci. Technol. B 9, 3569 (1991). jvb JVTBD9 0734-211X
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 3569
- Vasile, M.J.¹ Grigg, D.² Griffith, J.E.³ Fitzgerald, E.⁴ Russell, P.E.⁵

10
- 0000299432
- apl APPLAB 0003-6951
- G. D. Skidmore and E. D. Dahlberg, Appl. Phys. Lett. 71, 3293 (1997). apl APPLAB 0003-6951
- (1997) Appl. Phys. Lett. , vol.71 , pp. 3293
- Skidmore, G.D.¹ Dahlberg, E.D.²

11
- 0028526815
- rsi RSINAK 0034-6748
- M. Rührig, S. Porthun, and J. C. Lodder, Rev. Sci. Instrum. 65, 3224 (1994). rsi RSINAK 0034-6748
- (1994) Rev. Sci. Instrum. , vol.65 , pp. 3224
- Rührig, M.¹ Porthun, S.² Lodder, J.C.³

12
- 0028748411
- K. Sueoka, K. Inagami, T. Imamura, K. Tatebe, and K. Mukasa, IMTC'94, Hamamatsu, 1419, (1994).
- (1994) IMTC'94, Hamamatsu , pp. 1419
- Sueoka, K.¹ Inagami, K.² Imamura, T.³ Tatebe, K.⁴ Mukasa, K.⁵

13
- 0001100813
- jaJAPIAU 0021-8979
- P. Grutter, D. Rugar, H. J. Mamin, G. Castillo, C. J. Lin, I. R. McFadyen, R. M. Valletta, O. Wolter, T. Bayer, and J. Greschner, J. Appl. Phys. 69, 5883 (1991). jap JAPIAU 0021-8979
- (1991) J. Appl. Phys. , vol.69 , pp. 5883
- Grutter, P.¹ Rugar, D.² Mamin, H.J.³ Castillo, G.⁴ Lin, C.J.⁵ McFadyen, I.R.⁶ Valletta, R.M.⁷ Wolter, O.⁸ Bayer, T.⁹ Greschner, J.¹⁰

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